Stable Use Cell phone motherboard layered middle test stand spring probe conductivity, overload stability, detection of small deviations in the value of more accurate.
Applicable Models This phone motherboard layered middle test frame is applicable for iPhone X, XS, XS Maximum.
Tapered Probe Our motherboard layering test frame has a tapered probe, not easy to get rosin, solder more accurate and easy.
Operation Mobile phone motherboard layered middle test stand without the need to place spacers, in turn, the RF motherboard, pin board, logic motherboard laminated stacked on the test stand base.
Accurate Alignment Measurement Value Our mobile phone motherboard layered test frame double headed probe accurately aligned with the small hole to enhance contact performance, fixed snap fastening, the motherboard does not warp, test data more accurate.
